Test 4 Flashcards
(100 cards)
how does mass spec find mass
forms ions, looks at mass to charge ratio and fragmentation (peak height comparison at diff masses
dalton
unit of MW. use as = to g/mol
1 AMU is =
mass of a proton
MS instrumentation order
inlet for sample, ion source (w vaccuum), mass analyzer, detector, processor/readout
vacuum pressure in MS
10-5 - 10-8 torr
TOF MS
accelerates ions from anode to cathode (detector) w no field, measures TOF (t = l/v)
quadrupole ms
4 metal rods, opposite rods have same charge, 2 + and 2 -, alternate between DC and AC. only ions that arent stuck to a side can pass through. can be low pass (light molecules can get through when the AC is applied to the negative rods), high pass (heavy molecules can get through with AC on the pos. rods - they are less moveable) and bandpass by varying these in tandem
double focus (ICP)
inductively coupled plasma. higher resolution than single, needs more amplification, uses 2 magnets or a magnet and electric field
single focus (magnetic sector)
uses magnetic field, ions move thru curved tube and those that match the curvature (within mass range) are able to exit. resolution limited by rate at which magnetic field can be changed.
ion trap analyzer
selects for ions by having heavier ones stay in orbit as radio frequency voltage on encircling electrode increases. to mass spec analyze, as this happens the destabilized species will fall to the detector in order of mass.
KE and m/z eq
1/2 mv^2 = zeV, so m/z = 2eVt^2/L^2
centripetal force eq
F = BzeV
centrifugal force eq
F = mv^2/r
electrospray ionization
at atomspheric temp and pressure, sample solvent moves thru needle with induced voltage, becomes charged, then is desolvated and as solvent leaves the analyte can become multiply charged.
m/z for FT MS equation (think for bonus)
= eB/2(pi)f
Faradays law in ion trap
spinning particle creates field
ICR-FT
uses ion cyclotron resonance. no collisions, measures freq of cycle to get the size of particle. directly measures time domain
orbitrap MS
type of ion trap with inner and outer electrode, ions spin around the inner part. holds few ions and needs very low pressure, but small and less expensive.
resolution for MS
m (avg) / delta m
external inlet system
aka batch. gas or liquid heated to 400 degrees, pressure 10-4 - 10-5 torr, moved in thru valve along with solvent gas.
LC and GC coupling with MS
inlet system, allows analyte components to enter MS already separated. in GC separating carrier gas from analyte uses jet separator where lighter gas sprays out and sample goes in straight line to inlet
electron impact source
bombarding sample with e- to cause ion formation. can cause too much fragmentation of sample
chemical ionization source
sample ionized using ions, less fragmentation
field ionization
sample gas is moved thru ion source, less fragmentation than chemical