Week 9 Flashcards

(35 cards)

1
Q

Briefly describe the SEM.

A
  1. Beating light diffraction with electrons to go sub-nm
  2. Electron-matter interactions
    extracting information from matter
  3. Imaging with SEM maximises resolution
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2
Q

What is equation for minimum feature resolvable by microscope?

A

2d = lambda/ n sintheta

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3
Q

What is an Elastic interaction?

A

No energy is transferred to the sample

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4
Q

What does the scattering angle tell you about the sample?

A

The scattering angle
increases with
the atomic number Z -
information about
composition and thickness
of the sample

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5
Q

What is Elastic Interactions?

A

Some energy is transferred to the sample.

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6
Q

What are examples of inelastic interactions?

A

Cathodoluminescence-Plasmons

X-Rays -Composition

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7
Q

How are x-rays used in SEM?

A

Measuring the wavelength of the X-rays, provides precise information about the material constituents

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8
Q

How is the image formed in SEM?

A

The electron beam goes thorough scanning coils and hits the sample on a scan raster. The detector detects the backscattered electrons and the signal goes to the amplifier and is displayed on a monitor.

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9
Q

How does an oblique edge correspond to the image brightness?

A

Volume from which
secondary electrons can escape is larger -
Edges appear brighter.

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10
Q

What is cathodoluminescence microscopy in terms on excitation?

A

Optical modes
can be excited with SEM - energy from the beam is deposited in the
electron bath (or e-h pairs in semiconductors).

Excites optical modes -decay into
photons which are detected (or creates e-h
pairs which decay into photons).

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11
Q

What is cathodoluminescence limited by?

A

Limited by the lateral size of the electron
beam (approximately 5 – 10 nm).

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12
Q

How does cathodoluminescence work?

A

*Electron beam scanned over the sample through a hole in a parabolic reflector.

*Emitted light imaged on the detector with a spectrum recorded for each position of the electron beam.

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13
Q

How is the emitted light intensity related to the EM field intensity at a given point?

A

Emitted light intensity at a given wavelength is proportional to the local density of photonic states (LDOS).

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14
Q

What do secondary electrons tell us?

A

Provide information about
the topography - with the signal
enhanced at edges/discontinuities.

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15
Q

What do back scatter electrons tell us?

A

Sensitive to the atomic
number - provide compositional contrast in images.

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16
Q

What do X-rays tell us?

A

Identify atomic
species based on their quantised electron energy levels.

17
Q

How does AFM work?

A

*Scanning a sharp probe over the surface of a sample in a raster pattern.

  • By monitoring the movement of the probe, a 3-D image of
    the surface can be
    constructed.
18
Q

How does the cantilever mechanism work?

A

Cantilever comprised of silicon
nitride or silicon, undergoes deflection.

Deflects a laser which whose position is measured using a quadrant
photo-diode.

19
Q

What are VDW?

A

*Longer
range attractive forces, which may be felt at
separations of up to 10 nm or more. They arise
due to temporary fluctuating dipoles.

20
Q

What are the tip-sample forces in AFM?

A

*Van der Waals interactions

  • Coulombic Interactions
21
Q

What is the Coulombic interaction?

A

This strong, short
range repulsive force arises from electrostatic
repulsion by the electron clouds of the tip and
sample. This repulsion increases as the
separation decreases.

22
Q

As the tip is moved, what are the forces?

A

*Tip close to sample - VDW cause attraction, increasing
closer to the surface.

*At small separations the repulsive
coulombic forces become dominant.

23
Q

Describe instrumentation/probe issues? How would you minimise these issues?

A

*Tip may pick up loose debris from the
sample surface.

Reduced by cleaning the sample with compressed air or
N2 before use.

*Tip can be damaged
during scanning, which degrades the images.

24
Q

What is an application of AFM beyond surface imaging?

A

Pizeoresponse

25
How is AFM used in Pizeoresponse?
Apply a voltage between the AFM tip and sample - the expansion of the material may be measured and samples electric polarisation may be switched by a high enough electric field.
26
How is the ability to probe close to a surface advantageous?
Allows this technique to reach evanescently decaying fields, before their intensity has dropped to low to be measured.
27
Why is scanning near-field optical microscopy needed?
*Localised regions of high electromagnetic field enhancement are observable *Imaging fluorescence *Imaging SPP
28
What are disadvantges of SNOM?
*Small (sub-wavelength) aperture required – tricky and time consuming to fabricate. *It takes a long time to get a single image (30 minutes) * Metal probe can change the electromagnetic properties you’re observing.
29
Advantages of SNOM
 Cheaper equipment  Insulating samples can be studied  Liquid samples can be studies  Doesn’t require a vacuum  No influence of substrate luminescence
30
Advantages of CL
 Faster data acquisition for multiple images.  Doesn’t require highly technical probe fabrication.  Limited influence of ‘probe’ on the optical fields.
31
How does SNOM work?
Probes are made from tapered, ultrasharp optical fibres, which allow the light to be directed towards a photo-detector, and the optical near field on the surface can then be mapped.
32
What are the three AFM modes of operation? slide 15
contact, tapping, non-contact
33
Contact mode advantages and disadvantages
Adv: *High scan speeds *Rough samples scanned more easily DisAdv: *Lateral (shear) forces may distort image. *In ambient conditions may get strong capillary forces due to adsorbed fluid layer
34
Tapping mode advantages and disadvantages
Adv: *Lateral forces almost eliminated *Higher lateral resolution on most samples *Lower forces so less damage to soft samples or tips DisAdv: *Slower scan speed than in contact mode
35
Non-contact mode advantages and disadvantages.
Adv: *Both normal and lateral forces are minimised, good for soft samples. DisAdv: *In ambient conditions the adsorbed fluid layer may be too thick for effective measurements *Slower scan speed than tapping and contact modes