Extra EM Techniques Flashcards
(7 cards)
STM
Scanning Tunnelling Microscope
Res ~ 0.1nm
Quantum mechanical tunnelling effect > e- tunnel through a vacuum barrier between a sharp tip and the surface > creates a CURRENT that maps surface topography!
only suitable for conductive samples
AFM
Atomic Force Microscope
Physical cantilever with sharp tip in end to measure the forces between atoms in tip, and in sample
BOTH conductive (electrode surfaces) and Non-conductive (proteins/DNA) materials!
High-res imaging (topographical mapping)
Force spectroscopy (interfacial forces)
Material property characterisation (nanoscale material properties adhesion, friction, stiffness, etc.)
AFM modes
Contact mode
- tip constant contact w surface
1) constant height > scanner height fixed, deflection>topo
2) constant force > feedback loop adjusts scanner height to maintain constant deflection
- best for hard, can damage soft
Non-contact mode
- tip oscillates above the surface
- oscillation amplitude is kept constant via feedback loop
- protects samples, but lower res, requires stable conditions
Tapping (intermittent) mode
- hybrid of above
- oscillates, but taps surface at bottom of each swing
- oscillation amplitude is kept constant via feedback
- high res
AFM applications
- nanomechanical properties, (resistance to deformation, stiffness)
- normal force + friction measurements in hydrogels (want low friction, long lasting gels)
- HIGH SPEED TYPE: video-rate, produces 50 frames per second, visualise dynamic behaviours at interfaces
CryoEM overcomes what EM issues?
- possible to image hydrated/liquid samples
- stabilise beam-sensitive samples
- samples preserved closer to native/natural state
- structural, elemental, crystallographic data
SPA
Single Particle Analysis
- reveals 3D structure of small proteins and macromolecules down to a few Angstrom resolution
- alternative to x-ray cryst. and NMR > these tehcniques require small molecules/for it to be crystallised and no good for large or enzymes
CHALLENGES AND SOLNS OF CLEM
1) Sample compatibility {do OM first, EM second}
2) Sample prep {gridded sample holders, motorized microscope stages, find 3 points and triangulate}
3) photons are not electrons {ph travel in straight lines, e- spiral, un-twist the e- by calibrating distortion}
4) resolution gap {use deconvolution, undo “point spread” caused by optics}
5) navigating the cell {identify the cut depth to find the TEM section that matches the optical segment}