Transmission Electron Microscopy Flashcards
(9 cards)
sample requirements
Dry (inside TEM is vacuum - liquids will evap/may cause damage)
Conductive (electrons have to be able to pass through sample)
Non-magnetic (strongly magnetic samples interfere with the electron beam/may be pulled off sample holder)
Stable under e beam (if it damages quickly, can’t analyse)
Thin (to allow e to pass through ~100nm)
Bright field imaging
Collect the lightly scattered electrons
Objects that scatter the electrons more will be darker
Dark field imaging
Collect the heavily scattered electrons
Objects that scatter the electrons more will be brighter
REASONS for mass-thickness contrast
diffraction contrast
MASS
- atoms of high atomic number have high nuclear charge
- high atomic number (heavy) samples scatter e- more
CHARGE
- e- takes longer to travel through thick samples
- the longer the e- is in the sample, the more chance it will scatter
DIFFRACTION
- if the sample is crystalline > orientation dictates scattering
Applications of TEM imaging
- particle size
- surface coating
- complex particle structure > biomed app
- cell structure > impact of bioengineered structure on biology
- particle uptake in cells
- microstructure/layering > components of a transistor, quality control and manufacturing
- grain size and shape > polycrystalline material grains
HRTEM
High Resolution TEM
- image of atomic planes and their arrangement
- MASS/THICKNESS does NOT apply, contrast is due to complicated physics
- Fourier transform (FT)> to show frequencies in the image, determine atomic composition
- applications: crystal structure, or amorphous, imperfections, coatings (!)
STEM
Scanning TEM
Focus beam into small probe, scan it across, collect transmitted AND scattered e- at each point
multiple detectors!
STEM detectors
Bright Field
- small scattering angles
- heavy/thick things are darker
Dark Field
- medium scattering angles
- heavy/thick things are brighter
High Angle Annular Dark Field
- large scattering angles
- heavy/thick things are brighter
- NO DIFFRACTION EFFECTS
Electron tomography (TEM techniques)
Acquire a series of images at different tilts
Combine 2D images with software to make 3D image