Electron and Ion Spectrometer Flashcards by Khristine Tapado

Surface is usually more than _____ atomic layer deep
and is a region of ________ atomic potentials.
a) One, uniform
b) One, non-uniform
c) Two, uniform
d) Two, non-uniform

b) One, non-uniform

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Surface analysis can provide information that classic
methods like microscopic cannot.
a) True
b) False

a) True

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In surface spectrometer, which of the following beam is analysed?
a) Reflected beam
b) Absorbed beam
c) Refracted beam
d) Incident beam

a) Reflected beam

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Which of the following is a type of electron
spectroscopy?
a) MIKES
b) Auger spectroscopy
c) Secondary ion mass spectroscopy
d) Ion scattering spectroscopy

b) Auger spectroscopy

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Which of the following methods utilizes the emission of low energy electrons in a process?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy

a) Auger electron spectroscopy

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Surface analysis cannot provide any chemical
information directly.
a) True
b) False

b) False

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Which of the following is also known as X-ray
photoelectron spectroscopy?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy

c) Electron spectroscopy for chemical analysis

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Which of the following is the abbreviation of ESCA?
a) Electron scattering chemical analysis
b) Emission spectroscopy combination analysis
c) Electron spectroscopy for chemical analysis
d) Electron spectrum chemically analysed

c) Electron spectroscopy for chemical analysis

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Which of the following methods use soft X-rays to eject electrons from inner shell orbitals?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy

c) Electron spectroscopy for chemical analysis

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The kinetic energy of the photoelectron energies is
dependent on _________ of the atom, which makes XPS
useful to identify the oxide state.
a) Mass
b) Charge
c) Chemical environment
d) Volume

c) Chemical environment

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Electron spectroscopy is based on the ionization
phenomenon.
a) True
b) False

a) True

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Which of the following is the abbreviation of SIMS?
a) Secondary ion mass spectroscopy
b) Spectrum ionization mass spectroscopy
c) Scattering ions mass spectroscopy
d) Spectral ionization mass spectroscopy

a) Secondary ion mass spectroscopy

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Ion etching techniques provides the depth profiling from the surface.
a) True
b) False

a) True

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ESCA gives sufficient chemical information up to a depth about ________ armstrong in metals.
a) 5-20
b) 15-40
c) 40-100
d) 100-200

a) 5-20

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ESCA gives sufficient chemical information up to a depth about ________ armstrong in oxide.
a) 5-20
b) 15-40
c) 40-100
d) 100-200

b) 15-40

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Discrete electrons cannot be observed in electron
ionization of an atom due to which of the following
reasons?
a) Environmental disturbances
b) Same mass
c) Same charge
d) Electron- electron interaction

d) Electron- electron interaction

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The kinetic energy of the ejected photoelectron is
dependent upon the energy of which of the following?
a) Ions around
b) Photons around
c) Material
d) Impinging photon

d) Impinging photon

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ESCA gives sufficient chemical information up to a depth about ________ armstrong in polymers.
a) 5-20
b) 15-40
c) 40-100
d) 100-200

c) 40-100

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ESCA can identify elements in the periodic table above which of the following?
a) Carbon
b) Boron
c) Helium
d) Potassium

c) Helium

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In the spectrum, two main peaks at _________ and
________ are observed.
a) 284.6, 532.5
b) 248.6, 523.5
c) 264.8, 535.2
d) 246.8, 553.2

a) 284.6, 532.5

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ESCA focusses on which of the following information?
a) Mass of the electron
b) Charge of the electron
c) Binding energy of the electron
d) Mass of atoms

c) Binding energy of the electron

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284.6 eV matches which of the following specific atom
type?
a) Carbon
b) Oxygen
c) Nitrogen
d) Argon

a) Carbon

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532.5 eV matches which of the following specific atom
type?
a) Carbon
b) Oxygen
c) Nitrogen
d) Argon

b) Oxygen

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By studying which of the following can we determine if the surface corresponds to C-O or C=O chemical form?
a) Mass of the electron
b) Energy of the carbon peak
c) Binding energy
d) Charge of electron

b) Energy of the carbon peak

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1. The characterisation of auger spectroscopy can be achieved up to which of the following depths? a) 1 nm b) 2 nm c) 4 nm d) 8 nm

a) 1 nm

2. Auger electron spectroscopy can be used for surface chemical analysis in a way similar to which of the following? a) ESCA b) SIMS c) ISS d) Ion spectroscopy

a) ESCA

3. AES is limited when it comes to very high resolution studies. a) True b) False

a) True

4. Qualitative chemical analysis is very often performed using which of the following? a) ESCA b) SIMS c) AES d) Ion spectroscopy

c) AES

5. Electron ionization can produce which of the following? a) ESCA electron b) Auger electron c) Ion d) Photon

b) Auger electron

6. Electron ionisation can produce ESCA electrons. a) True b) False

b) False

9. In Auger process, an electron drops to fill which of the following? a) 1s hole b) 1p hole c) 2s hole d) 2p hole

a) 1s hole

7. Which of the following is an Auger transition starting from a hole in 1s levels which would be filled up from the 2p level? a) KLM transition b) KLL transition c) LMN transition d) LLM transition

10. Auger electron spectroscopy involves the irradiation of the surface to be analysed with a beam of electrons of energy in the _________ range. a) 1-2 KeV b) 2-4 KeV c) 4-8 KeV d) 1-8 KeV

a) 1-2 KeV

8. In ESCA process, the photon ejects which of the following? a) 1s electron b) 1p electron c) 2s electron d) 2p electron

b) 1p electron

11. In Auger spectroscopy, beam currents are typically _____ in a beam of diameter 0.5mm. a) 5-10 µA b) 5-20 µA c) 5-30 µA d) 5-50 µA

d) 5-50 µA

12. Which of the following is the detection limit of Auger Electron Spectroscopy? a) 0.1% monolayer b) 0.5% monolayer c) 1% monolayer d) 2% monolayer

b) 0.5% monolayer

13. Which of the following denotes the sample destruction that occurs in Auger electron spectroscopy? a) None in 95% of sample b) None in 99% of sample c) None in 100% of sample d) Frequent

d) Frequent

14. How is the specificity of Auger electron spectroscopy? a) Very bad b) Bad c) Good d) Very good

c) Good

15. AES is more sensitive than XPS because of which of the following factors? a) Binding energies of electrons b) Kinetic energies of electrons c) Mass of electrons d) Mass to charge ratio of electrons

b) Kinetic energies of electrons

1. A basic X-ray source includes which of the following components? a) Large target anode b) Large target cathode c) Small target anode d) Small target cathode

a) Large target anode

2. The anode is held at __________ positive potential and the filament is held at ____________ potential. a) High, ground b) Ground, high c) Low, high d) High, low

a) High, ground

3. Which of the following is one of the most commonly used anode material? a) Carbon b) Tungsten c) Magnesium d) Cesium

c) Magnesium

4. Which is the most intense line in the X-ray spectrum? a) Kα1 b) Kα2 c) Kα12 d) Kα22

c) Kα12

5. Which of the following must be used with the X-ray source to have high energy resolution? a) Chopper b) Vacuum chamber c) Accelerator d) Monochromator

d) Monochromator

6. Magnetic deflection energy analysers are effective than electrostatic types. a) True b) False

a) True

7. Double-pass cylindrical mirror energy analyser has how many mirrors? a) One b) Two c) Three d) Four

b) Two

9. Which of the following is the most commonly used detector in ESCA and AES? a) Electron multiplier b) Dynodes c) Photovoltaic cell d) Photomultiplier

a) Electron multiplier

8. In spherical sector analyser, __________ is detected and plotted as a function of energy. a) Mass b) Charge c) Number of electrons striking the detector d) Mass to charge ratio

c) Number of electrons striking the detector

11. The output of the multiplier is fed to which of the following immediately? a) Pulse amplifier discriminator b) DAC c) ADC d) Multichannel analyser

a) Pulse amplifier discriminator

10. Electron detector has a _______ doped glass tube with a secondary semiconducting coating. a) Quartz b) Silica c) Lead d) Cesium

c) Lead

12. Which of the following is the ideal vacuum for electron spectrometers? a) 10-6 torr b) 10-7 torr c) 10-8 torr d) 10-9 torr

a) 10-6 torr

13. Which of the following is the most commonly used magnetic shielding? a) Helmholtz coils b) Ferro-magnetic shielding c) Faraday shield d) Magnetometer probe

b) Ferro-magnetic shielding

14. Charging effect can be suppressed by supplying flood of electrons having which of the following? a) Uniform low energy b) Uniform low mass c) Uniform high energy d) Uniform high mass

a) Uniform low energy

15. Synchroton radiation has several advantages over conventional radiation. a) True b) False

a) True

1. In Ion spectroscopy, the primary ion is usually which of the following? a) Inert gas ion b) Halogen ion c) Oxygen group gas ion d) Hydrogen

a) Inert gas ion

2. The kinetic energy of the primary ion should be in which of the following range? a) 0.1-4 keV b) 0.2-1 keV c) 0.4-2 keV d) 0.3-5 keV

d) 0.3-5 keV

3. If the primary ion is elastically scattered, the kinetic energy of the reflected primary ion will depend on which of the following? a) Charge of the primary ion b) Charge of the surface ion c) Mass of the surface ion d) Number of surface ions

c) Mass of the surface ion

4. Which of the following causes the phenomena of sputtering? a) Primary ion gets embedded in the solid b) Primary ion is elastically scattered c) Primary ion is reflected d) Primary ion is refracted

a) Primary ion gets embedded in the solid

5. The fragments formed during sputtering can be either neutral atoms or ions. The ions can only be positive. a) True b) False

b) False

6. Which of the following is the energy range of ISS? a) 1 keV b) 2 keV c) 4 keV d) 8 keV

a) 1 keV

8. Both ISS and SIMS have depth profiling capability. a) True b) False

a) True

7. Which of the following is the spectral range of SIMS? a) 0-10 amu b) 0-100 amu c) 0-500 amu d) 0-1000 amu

c) 0-500 amu

9. Which of the following is denotes the absolute quantitative analysis of SIMS? a) 30% b) 70% c) 50% d) Not possible

d) Not possible

10. Which of the following is the amount of matrix effect that occurs in SIMS? a) Very low b) Low c) Some d) Severe

d) Severe

11. Which of the following is the x-y resolution of ISS? a) 1 µ b) 10 µ c) 100 µ d) 1000 µ

c) 100 µ

12. Which of the following is the x-y resolution of SIMS? a) 1 µ b) 10 µ c) 100 µ d) 1000 µ

a) 1 µ

2. Only those electrons which are in a selected small solid angle are received in the ________ electrostatic analyser. a) 100o b) 127o c) 180o d) 263o

b) 127o

1. In ion spectroscopy, the positive ions are focussed on the sample at which of the following angles? a) 20o b) 30o c) 45o d) 90o

c) 45o

3. Which of the following can be used as the detector in ion spectroscopy? a) Faraday cup collector b) Channel electron multiplier c) Micro-channel plate d) Flame ionization detector

b) Channel electron multiplier

4. In order to obtain ISS spectra, the backscattered primary ions are sampled by which of the following? a) Faraday cup analyser b) Photographic analyser c) Micro-channel analyser d) Cylindrical mirror analyser

d) Cylindrical mirror analyser

6. It is advantageous to use ions from a variety of gases. a) True b) False

a) True

5. Which of the following is the energy after collision with a surface atom for a scattering angle of 90o when Eo is the energy of the incident ion, M1 is the mass of the incident ion and M2 is the mass of the target surface? a) Eo(M2-M1)/(M2+M1) b) Eo(M2+M1)/(M2-M1) c) Eo(M2×M1)/(M2+M1) d) Eo(M2-M1)/(M2×M1)

) Eo(M2-M1)/(M2+M1)

7. Which of the following gases is not often used in ion spectroscopy? a) Helium b) Argon c) Nitrogen d) Neon

c) Nitrogen

8. ISS is sensitive to every element heavier than which of the following? a) Helium b) Hydrogen c) Nitrogen d) Neon

a) Helium

9. Which of the following is the lightest isotope used as a primary ion? a) He b) 2^He c) 3^He d) 3^H

c) 3^He

10. The specificity will vary depending on the scattering gas used. a) True b) False

a) True

11. ISS is less sensitive than which of the following? a) SIMS b) Auger c) ESCA d) AES

a) SIMS

12. Which of the following is the detection limit of ISS for monolayer? a) 10 -1 % b) 10 -2 % c) 10 -3 % d) 10 -4 %

c) 10 -3 %

14. Which of the following is the range of quadrupole mass spectrometer used in SIMS? a) 100-200 amu b) 200-300 amu c) 500-1000 amu d) 200-500 amu

c) 500-1000 amu

13. After passing through the pre-filter, ions are passed through which of the following? a) Quadrupole mass spectrometer b) Time of flight mass spectrometer c) Radiofrequency mass spectrometer d) Magnetic deflection mass spectrometer

a) Quadrupole mass spectrometer

15. Which of the following is the resolution of quadrupole mass spectrometer used in SIMS? a) 1 amu b) 2 amu c) 5 amu d) 3 amu

a) 1 amu